About this scholarly article

2013 IEEE International Reliability Physics Symposium (IRPS) - Realistic 55nm IC failure in time (FIT) estimates from automotive field returns by Haggag, A.; Barr, A.; Walker, K.; Winemberg, L. is a scholarly article available to read on EtoBox.

Author

Haggag, A.; Barr, A.; Walker, K.; Winemberg, L.

Publisher

IEEE

Published

2013

Language

EN