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About this Materials Science article
XRAYL: a new powder diffraction profile fitting program by Stewart, J. M. ;Zhang, Y. ;Hubbard, C. R. ;Morosin, B. ;Venturini, E. L. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Stewart, J. M. ;Zhang, Y. ;Hubbard, C. R. ;Morosin, B. ;Venturini, E. L.
- Publisher
- International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)
- Published
- 1989
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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