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About this Engineering article
Evaluation of Write Error Rate for Voltage-driven Dynamic Magnetization Switching in Magnetic Tunnel Junctions with Perpendicular Magnetization by Shiota, Yoichi; Nozaki, Takayuki; Tamaru, Shingo; Yakushiji, Kay; Kubota, Hitoshi; Fukushima, Akio; Yuasa, Shinji; Suzuki, Yoshishige is a Engineering article available to read on EtoBox.
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- Author
- Shiota, Yoichi; Nozaki, Takayuki; Tamaru, Shingo; Yakushiji, Kay; Kubota, Hitoshi; Fukushima, Akio; Yuasa, Shinji; Suzuki, Yoshishige
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; Japan Soc of Applied Physics; IOP Publishing (ISSN 1882-0778)
- Published
- 2015
- Field
- Engineering (Physical Sciences)