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About this Engineering article
Estimation of Single-Event-Induced Collected Charge for Multiple Transistors Using Analytical Expressions by Assis, T. R.; Ni, K.; Kauppila, J. S.; Bhuva, B. L.; Schrimpf, R. D.; Massengill, L. W.; Wen, S.; Wong, R.; Slayman, C. is a Engineering article available to read on EtoBox.
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- Author
- Assis, T. R.; Ni, K.; Kauppila, J. S.; Bhuva, B. L.; Schrimpf, R. D.; Massengill, L. W.; Wen, S.; Wong, R.; Slayman, C.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)