About this scholarly article

2005 IEEE International Integrated Reliability Workshop - Impact of NBTI-Driven Parameter Degradation on Lifetime of a 90nm p-MOSFET by Wittmann, R.; Puchner, H.; Hinh, L.; Ceric, H.; Gehring, A.; Selberherr, S. is a scholarly article available to read on EtoBox.

Author

Wittmann, R.; Puchner, H.; Hinh, L.; Ceric, H.; Gehring, A.; Selberherr, S.

Publisher

IEEE

Published

2005

Language

EN