About this scholarly article

2015 IEEE International Reliability Physics Symposium - Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering by Kao, Tzu-Cheng; Lien, Chen-Hsin; Chiu, Chien-Wei; Lee, Jian-Hsing; Lo, Yen-Hsiang; Hung, Chung-Yu; Huang, Tsung-Yi; Su, Hung-Der is a scholarly article available to read on EtoBox.

Author

Kao, Tzu-Cheng; Lien, Chen-Hsin; Chiu, Chien-Wei; Lee, Jian-Hsing; Lo, Yen-Hsiang; Hung, Chung-Yu; Huang, Tsung-Yi; Su, Hung-Der

Publisher

IEEE

Published

2015

Language

EN