About this scholarly article

2018 48th European Solid-State Device Research Conference (ESSDERC) - Gated Four-Probe Method to Evaluate the Impact of SAM Gate Dielectric on Mobility in MoS2 FET by Kawanago, Takamasa; Oba, Tomoaki; Ikoma, Ryo; Takagi, Hiroyuki; Oda, Shunri is a scholarly article available to read on EtoBox.

Author

Kawanago, Takamasa; Oba, Tomoaki; Ikoma, Ryo; Takagi, Hiroyuki; Oda, Shunri

Publisher

IEEE

Published

2018