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Charging phenomena in PEEM imaging and spectroscopy by B Gilbert; R Andres; P Perfetti; G Margaritondo; G Rempfer; Gelsomina De Stasio is a Physics and Astronomy article available to read on EtoBox.

What is Charging phenomena in PEEM imaging and spectroscopy about?

Spectromicroscopy with the imaging technique of X-ray photoelectron emission microscopy (X-PEEM) is a microchemical analytical tool installed in many synchrotron radiation laboratories, and which is "nding application in diverse "elds of research. The method of sample analysis, X-ray absorption spectroscopy, does not encounter the same problems as X-ray photoemission spectroscopy when sample charging occurs, hence even good insulators may often be analyzed without any apparent artifacts in images or spectra. We show, however, that charging e!ects cannot be neglected. We model the e!ect of surface charge formation on the secondary electron yield from uniform samples to demonstrate that surface charge primarily reduces the yield of electrons which may contribute to the detected signal. We illustrate that on non-uniform insulating samples, localized centers of charge may substantially a!ect microscope imaging and resolution as the electrostatic "eld close to the surface is distorted. Finally, in certain circumstances non-uniform surface charge may lead to unexpected lineshapes in X-ray absorption spectra causing, in some extreme cases, negative spectra. These negative spectra are expl

Who reads Charging phenomena in PEEM imaging and spectroscopy?

Author

B Gilbert; R Andres; P Perfetti; G Margaritondo; G Rempfer; Gelsomina De Stasio

Publisher

Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-3991)

Published

2000

Language

EN

Field

Physics and Astronomy (Physical Sciences)