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About this Engineering article
Probabilistic Short-Circuit Uprating of Station Strain Bus System - Reliability and Operating Considerations by Ramani, N.; Wang, L.; Tanaka, W. H.; Macedo, F. X. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ramani, N.; Wang, L.; Tanaka, W. H.; Macedo, F. X.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; ScienceOpen; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0885-8977)
- Published
- 1986
- Language
- EN
- Field
- Engineering (Physical Sciences)
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