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About this Engineering article
Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias by Mukhopadhyay, S.; Mahmoodi, H.; Roy, K. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Mukhopadhyay, S.; Mahmoodi, H.; Roy, K.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0278-0070)
- Published
- 2008
- Field
- Engineering (Physical Sciences)