About this scholarly article

SPIE Proceedings [SPIE International Conference on Optical Metrology - Pultusk Castle, Poland (Wednesday 20 October 1999)] Interferometry '99: Techniques and Technologies - Quantitative phase analysis in retardation-modulated differential interference contrast (RM-DIC) microscope by Ishiwata, Hiroshi; Yatagai, Toyohiko; Itoh, Masahide; Tsukada, Akihiro; Kujawinska, Malgorzata; Takeda, Mitsuo is a scholarly article available to read on EtoBox.

Author

Ishiwata, Hiroshi; Yatagai, Toyohiko; Itoh, Masahide; Tsukada, Akihiro; Kujawinska, Malgorzata; Takeda, Mitsuo

Publisher

SPIE

Published

1999