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About this Engineering article

Statistical Analysis of Soft Error Rate in Digital Logic Design Including Process Variations by Jian Yao, ; Zuochang Ye, ; Miao Li, ; Yanfeng Li, ; Schrimpf, R. D.; Fleetwood, D. M.; Yan Wang, is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Jian Yao, ; Zuochang Ye, ; Miao Li, ; Yanfeng Li, ; Schrimpf, R. D.; Fleetwood, D. M.; Yan Wang,
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
Published
2012
Language
EN
Field
Engineering (Physical Sciences)

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