About this scholarly article

2009 IEEE MTT-S International Microwave Symposium Digest - Low frequency noise in nanoscale pMOSFETs with strain induced mobility enhancement and dynamic body biases by Yeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn is a scholarly article available to read on EtoBox.

Author

Yeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn

Publisher

IEEE

Published

2009