About this document
IDDQ Testing Overview and Fault Detection by RajasekharVenkata is a document available to read on EtoBox.
The document outlines inductive fault analysis and IDDQ testing techniques. It discusses how inductive fault analysis uses defect statistics, layout data, and fabrication processes to generate realistic fault lists. It also explains how IDDQ testing can detect faults by monitoring current flow, provides advantages of IDDQ testing such as ease of detection and shorter test lengths, and discusses circuit constraints and design rules to ensure faults are detectable by IDDQ. Additionally, it covers topics such
- Author
- RajasekharVenkata
- Language
- EN