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About this Engineering article
Investigation of the influence of boundary effects on the stability and TCR of thin-film resistors by R. R. Avanesyan; Yu. P. Lazarev; A. N. Lugin; A. M. Tartakovskii is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- R. R. Avanesyan; Yu. P. Lazarev; A. N. Lugin; A. M. Tartakovskii
- Publisher
- Springer US; Springer-Verlag; Springer New York LLC; Springer Science and Business Media LLC (ISSN 0543-1972)
- Published
- 1996
- Language
- EN
- Field
- Engineering (Physical Sciences)
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