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What is Hard Errors in Integrated Circuits about?
Hard errors problems include oxide wearout, interconnect wearout, overvoltage failure, and latchup. Oxide wearout occurs over time as gate oxides are stressed, causing threshold voltages to shift and leakage currents to increase until circuit failure. Interconnect wearout damages wires over time from electromigration due to high current densities flowing through wires. Overvoltage failure can damage tiny transistors from low voltages due to power supply transients or electrostatic discharge. Latchup was an
- Author
- Chatla Pavan
- Language
- EN