About this scholarly article

2005 Siberian Conference on Control and Communications - The Influence of Thermal Annealing on Sensitivity of Silicon MOS-Diodes to Reducing Gases by Baljuba, V.I.; Grisyk, V.Y.; Davidova, T.A.; Nazarov, S.S.; Khludkova, L.S.; Kalygina, V.M.; Panin, A.V. is a scholarly article available to read on EtoBox.

Author

Baljuba, V.I.; Grisyk, V.Y.; Davidova, T.A.; Nazarov, S.S.; Khludkova, L.S.; Kalygina, V.M.; Panin, A.V.

Publisher

IEEE

Published

2005