About this scholarly article

2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) - Frequency response of stress-effects on CMOS power amplifiers by Cattaneo, A.; Pinarello, S.; Mueller, J.-E.; Weigel, R. is a scholarly article available to read on EtoBox.

Author

Cattaneo, A.; Pinarello, S.; Mueller, J.-E.; Weigel, R.

Publisher

IEEE

Published

2014