About this scholarly article

2012 IEEE International SOI Conference (SOI) - RF SOI CMOS technology on commercial trap-rich high resistivity SOI wafer by Ben Ali, K. (author);Roda Neve, C. (author);Gharsallah, A. (author);Raskin, J. P. (author) is a scholarly article available to read on EtoBox.

Author

Ben Ali, K. (author);Roda Neve, C. (author);Gharsallah, A. (author);Raskin, J. P. (author)

Publisher

IEEE

Published

2012