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About this Materials Science article
Defect Detection on Patterned Fabrics Using Distance Matching Function and Regular Band by Jing, Junfeng; Yang, Panpan; Li, Pengfei is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Jing, Junfeng; Yang, Panpan; Li, Pengfei
- Publisher
- SAGE Publications; Assoc Nonwoven Fabrics Ind; [Cary N.C.]: INDA TAPPI the Fiber Society and AATCC; [London]: SAGE (ISSN 1558-9250)
- Published
- 2015
- Language
- EN
- ISBN
- 9781558925014
- Field
- Materials Science (Physical Sciences)