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Can I read Spectroscopic Ellipsometry of Single and Multilayer Amorphous Germanium/aluminum Thin Film Systems on EtoBox?
Spectroscopic Ellipsometry of Single and Multilayer Amorphous Germanium/aluminum Thin Film Systems by A.A. Al-Mahasneh; H.A. Al Attar; I.S. Shahin is a Engineering article available to read on EtoBox.
What is Spectroscopic Ellipsometry of Single and Multilayer Amorphous Germanium/aluminum Thin Film Systems about?
We have measured and analyzed the optical characteristics of single and multilayer amorphous germanium/aluminum (a-Ge/Al) systems prepared by vacuum evaporation on glass substrates. The characterization of each layer was achieved separately, and then a comprehensive model was used to characterize the multilayer structure. The Tauc-Lorentz model (TL) was used to characterize a-Ge layers of different thicknesses ranging from 10 to 150 nm. Average values of the optical constants of a-Ge were determined using multiple sample analysis. The thicknesses of the multilayer components were accurately determined.
Who reads Spectroscopic Ellipsometry of Single and Multilayer Amorphous Germanium/aluminum Thin Film Systems?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- A.A. Al-Mahasneh; H.A. Al Attar; I.S. Shahin
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0030-4018)
- Published
- 2003
- Language
- EN
- Field
- Engineering (Physical Sciences)
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