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About this Engineering article
Using thin film stress to produce precision, figured X-ray optics by F. Yuan; Y. Shi; L.V. Knight; R.T. Perkins; D.D. Allred is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- F. Yuan; Y. Shi; L.V. Knight; R.T. Perkins; D.D. Allred
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1992
- Language
- EN
- Field
- Engineering (Physical Sciences)
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