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Electron probe microanalysis (EPMA) is a technique that allows for both qualitative and quantitative elemental analysis of materials on a micrometer scale. It works by using an electron beam to excite an area of a sample, which then emits x-rays that are characteristic of the elements present. EPMA systems consist of an electron gun, lenses, detectors, and a vacuum chamber. They can produce high-resolution images of sample surfaces and determine elemental compositions down to parts-per-million levels. EPMA

Author

kishan kumar

Language

EN