About this scholarly article

Effect of lightly doped drain on the electrical characteristics of CMOS compatible vertical MOSFETs by Rubel, D. H. ;Sun, Kai ;Hall, S. ;Ashburn, P. ;Hakim, M. M. A. is a scholarly article available to read on EtoBox.

Author

Rubel, D. H. ;Sun, Kai ;Hall, S. ;Ashburn, P. ;Hakim, M. M. A.

Publisher

IEEE

Published

2015

Language

EN