About this scholarly article

Method of Diagnosing Multiple Stuck-at-faults in Combinational Circuits by Teruhiko Yamada; Shuji Hamada; Tatsuo Matsumoto; Toshihiko Takahashi; Takao Nakayama is a scholarly article available to read on EtoBox.

Author

Teruhiko Yamada; Shuji Hamada; Tatsuo Matsumoto; Toshihiko Takahashi; Takao Nakayama

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0882-1666)

Published

1991

Language

EN