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About this Engineering article
Elimination of Enhanced Low-Dose-Rate Sensitivity in Linear Bipolar Devices Using Silicon-Carbide Passivation by Shaneyfelt, M.R.; Maher, M.C.; Camilletti, R.C.; Schwank, J.R.; Pease, R.L.; Russell, B.A.; Dodd, P.E. is a Engineering article available to read on EtoBox.
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- Author
- Shaneyfelt, M.R.; Maher, M.C.; Camilletti, R.C.; Schwank, J.R.; Pease, R.L.; Russell, B.A.; Dodd, P.E.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2006
- Language
- EN
- Field
- Engineering (Physical Sciences)