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About this Physics and Astronomy article

On the analysis of x-ray-diffraction line profiles from small epitaxial binary diffusion couples: Determination of concentration profile and influence of TDS by Delhez, R.; Mittemeijer, E. J. is a Physics and Astronomy article available to read on EtoBox.

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Author
Delhez, R.; Mittemeijer, E. J.
Publisher
American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
Published
1978
Language
EN
Field
Physics and Astronomy (Physical Sciences)

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