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ToFD for Sizing Rough Defects by Chonkarn Chieblam is a document available to read on EtoBox.
What is ToFD for Sizing Rough Defects about?
This document discusses using time-of-flight diffraction (ToFD) methods to size rough planar defects using theoretical modeling and simulations. ToFD relies on measuring the arrival times of waves diffracted from defect tips to determine size, but this is complicated for rough defects due to multiple scattering. The paper investigates how roughness affects ToFD accuracy and optimal incident angles through finite element modeling and Monte Carlo simulations. It finds that roughness can make sizing more uncer
- Author
- Chonkarn Chieblam
- Language
- EN