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N-Well vs P-Well in Semiconductor Yield by ahmed shafeey is a document available to read on EtoBox.
What is N-Well vs P-Well in Semiconductor Yield about?
The document discusses advanced electronics focusing on the processes of P-well and N-well diffusion in semiconductor manufacturing, emphasizing their impact on threshold voltage and yield. It explains yield parameters, including defect density and the yield equation, and provides an example calculation for chip yield and working chips. Additionally, it introduces the Gajski-Kuhn chart, which outlines the hierarchical levels and domains in hardware design.
- Author
- ahmed shafeey
- Language
- EN