About this scholarly article

A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS by Loveless, T.D.; Massengill, L.W.; Bhuva, B.L.; Holman, W.T.; Reed, R.A.; McMorrow, D.; Melinger, J.S.; Jenkins, P. is a scholarly article available to read on EtoBox.

Author

Loveless, T.D.; Massengill, L.W.; Bhuva, B.L.; Holman, W.T.; Reed, R.A.; McMorrow, D.; Melinger, J.S.; Jenkins, P.

Publisher

IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)

Published

2007

Language

EN