About this scholarly article

SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Optomechatronic Systems II - Inspection system for microelectronics BGA package using wavelength scanning interferometry by Kang, Chul-moo; Woo, Hyun G.; Cho, Hyungsuck; Han, Jae W.; Lee, Jae-Yong; Cho, Hyungsuck is a scholarly article available to read on EtoBox.

Author

Kang, Chul-moo; Woo, Hyun G.; Cho, Hyungsuck; Han, Jae W.; Lee, Jae-Yong; Cho, Hyungsuck

Publisher

SPIE

Published

2001