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Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices: Proceedings of the NATO Advanced Research Workshop on Fundamental Aspects of Ultrathin ... Science Partnership Subseries: 3 Book 47) by L C Feldman, E. P. Gusev, E. Garfunkel (auth.), Eric Garfunkel, Evgeni Gusev, Alexander Vul’ (eds.) is a engineering available to read on EtoBox.
What is Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices: Proceedings of the NATO Advanced Research Workshop on Fundamental Aspects of Ultrathin ... Science Partnership Subseries: 3 Book 47) about?
An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.
Who reads Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices: Proceedings of the NATO Advanced Research Workshop on Fundamental Aspects of Ultrathin ... Science Partnership Subseries: 3 Book 47)?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- L C Feldman, E. P. Gusev, E. Garfunkel (auth.), Eric Garfunkel, Evgeni Gusev, Alexander Vul’ (eds.)
- Publisher
- Springer Netherlands : Imprint : Springer
- Published
- 1998
- Language
- EN
- ISBN
- 9780792350071
- Category
- engineering
- Subjects
- Science, Technology, Engineering
- Updated
- 2026-03-25
More by L C Feldman, E. P. Gusev, E. Garfunkel (auth.), Eric Garfunkel, Evgeni Gusev, Alexander Vul’ (eds.)
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