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About this Engineering article
Characterization of 4H-SiC Bipolar Junction Transistor at High Temperatures by Zhang, Nuo; Rao, Yi; Xu, Nuo; Maralani, Ayden; Pisano, Albert P. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zhang, Nuo; Rao, Yi; Xu, Nuo; Maralani, Ayden; Pisano, Albert P.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)