Can I read JEDEC JESD22-A108C: Device Life Testing on EtoBox?

JEDEC JESD22-A108C: Device Life Testing by maxlegacy0478 is a document available to read on EtoBox.

What is JEDEC JESD22-A108C: Device Life Testing about?

The JEDEC standard JESD22-A108C outlines a test method for assessing the effects of temperature and bias on solid state devices over time, primarily for device qualification and reliability monitoring. It details the necessary apparatus, procedures, and conditions for conducting the tests, including stress duration and measurement requirements. The document also includes information on failure criteria and differences from its previous version, JESD22-A108B.

Author

maxlegacy0478

Language

EN