About this scholarly article

2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - A variational thermodynamic approach for modeling internal capacitances of Trench Insulated Gate Bipolar Transistors (TIGBTs) to interpret measured capacitance-voltage characteristics by Sattar, Md A.; Gunther, Norman G.; Rahman, Mahmudur is a scholarly article available to read on EtoBox.

Author

Sattar, Md A.; Gunther, Norman G.; Rahman, Mahmudur

Publisher

IEEE

Published

2012

Language

EN