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About this Engineering article
Electrical Analyses of Germanium MIS Structure and Spectroscopic Measurement of the Interface Trap Density in an Insulator/Germanium Interface at Room Temperature by Fukuda, Y.; Otani, Y.; Itayama, Y.; Ono, T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Fukuda, Y.; Otani, Y.; Itayama, Y.; Ono, T.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2007
- Language
- EN
- Field
- Engineering (Physical Sciences)
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