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Advances in Time-of-flight Secondary Ion Mass Spectrometry Analysis of Protein Films by Roger Michel; David G. Castner is a Engineering article available to read on EtoBox.

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## Abstract This article reviews the advances made in the analysis of protein films by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). ToF‐SIMS has been used extensively to analyze biological samples owing to its high surface sensitivity, high mass resolution, molecular specificity and imaging capabilities. The fact that its information depth for molecular fragments is typically 1–2 nm, which is smaller than the dimensions of most proteins, makes it an ideal technique for analyzing protein films. Multivariate analysis (MVA) techniques are well suited for analyzing the large, complex data sets generated from ToF‐SIMS experiments on biological samples and have become widely used for interpreting ToF‐SIMS spectra and images. In recent years, new advances in polyatomic or cluster ion sources have improved spectral quality, reduced sample damage and enabled depth profiling of some organic samples. Also, cationization and other matrix enhancement methods have been developed, which significantly increase the yield of molecular fragments from biological samples. This review will cover the modern ToF‐SIMS analysis methods that are currently employed to characterize protein films

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Author

Roger Michel; David G. Castner

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)

Published

2006

Language

EN

Field

Engineering (Physical Sciences)