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2006 IEEE International Frequency Control Symposium and Exposition - Thermal characterization of crystal ovens used in phase noise measurement system by Sthal, F.; Galliou, S.; Abbe, P.; Franquet, N.; Vacheret, X.; Salzenstein, P.; Rubiola, E.; Cibiel, G. is a scholarly article available to read on EtoBox.

Author
Sthal, F.; Galliou, S.; Abbe, P.; Franquet, N.; Vacheret, X.; Salzenstein, P.; Rubiola, E.; Cibiel, G.
Publisher
IEEE
Published
2006
Language
EN

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