About this scholarly article

2009 IEEE International Memory Workshop - Fully Depleted Double-Gate 1T-DRAM Cell with NVM Function for High Performance and High Density Embedded DRAM by Park, Ki-Heung; Kim, Young Min; Kwon, Hyuck-In; Kong, Seong Ho; Lee, Jong-Ho is a scholarly article available to read on EtoBox.

Author

Park, Ki-Heung; Kim, Young Min; Kwon, Hyuck-In; Kong, Seong Ho; Lee, Jong-Ho

Publisher

IEEE

Published

2009

Language

EN