About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in Metrology for X-Ray and EUV Optics V - Ultra-high-precision surface processing techniques for nanofocusing ellipsoidal mirrors in hard x-ray region by Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand K.; Yumoto, Hirokatsu; Koyama, Takahisa; Matsuyama, Satoshi; Yamauchi, Kazuto; Ohashi, Haruhiko is a scholarly article available to read on EtoBox.

Author

Assoufid, Lahsen; Ohashi, Haruhiko; Asundi, Anand K.; Yumoto, Hirokatsu; Koyama, Takahisa; Matsuyama, Satoshi; Yamauchi, Kazuto; Ohashi, Haruhiko

Publisher

SPIE

Published

2014