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10Gb/s Wafer Probing Test Solutions by jalvesmo is a document available to read on EtoBox.

What is 10Gb/s Wafer Probing Test Solutions about?

DesignCon 2005 Paper titled "Addressing the Challenges of Implementing an At-Speed Production Test-Cell for 10Gb/s Wafer Probing". Authors are Jose Moreira, Gert Hänsel and Frank Koban. This paper describes the challenges of developing a production solution for testing 10Gb/s communication devices at-speed on a wafer prober.

Author

jalvesmo

Language

EN