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About this Engineering article
Xps Study of the PbSe/CaF2(111) Interface Grown on Si by MBE by Fang, X. M.; Liu, W. K.; McCann, P. J.; Strecker, B. N.; Santos, M. B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Fang, X. M.; Liu, W. K.; McCann, P. J.; Strecker, B. N.; Santos, M. B.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 1996
- Field
- Engineering (Physical Sciences)
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