About this scholarly article

SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Machine Vision Applications in Industrial Inspection IX - Model-based algorithm for localization and measurement of miniature SMC objects by Tyan, JennKwei; Fang, Ming; Hunt, Martin A. is a scholarly article available to read on EtoBox.

Author

Tyan, JennKwei; Fang, Ming; Hunt, Martin A.

Publisher

SPIE

Published

2001