About this scholarly article

1998 Midwest Symposium on Circuits and Systems (Cat. No. 98CB36268) - Fault simulation of built-in tester for CMOS switched-current circuits by Jin-Sheng Wang, ; Wei-Hsing Huang, ; Chin-Long Wey, is a scholarly article available to read on EtoBox.

Author

Jin-Sheng Wang, ; Wei-Hsing Huang, ; Chin-Long Wey,

Publisher

IEEE Comput. Soc

Published

1999

Language

EN