About this scholarly article

SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - Las Vegas, Nevada, United States (Sunday 20 March 2016)] Industrial and Commercial Applications of Smart Structures Technologies 2016 - Comparison of binary and multi-level logic electronics for embedded systems by Griffin, Steven F.; Damti, Shirly M.; Watkins, Steve E.; Stanley, R. J. is a scholarly article available to read on EtoBox.

Author

Griffin, Steven F.; Damti, Shirly M.; Watkins, Steve E.; Stanley, R. J.

Publisher

SPIE

Published

2016