About this scholarly article

2009 3rd International Symposium on Empirical Software Engineering and Measurement - Test coverage and post-verification defects: A multiple case study by Mockus, Audris; Nagappan, Nachiappan; Dinh-Trong, Trung T. is a scholarly article available to read on EtoBox.

Author

Mockus, Audris; Nagappan, Nachiappan; Dinh-Trong, Trung T.

Publisher

IEEE

Published

2009