About this scholarly article

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - A new path tracing algorithm with dynamic circuit extraction for sequential circuit fault diagnosis by Shigeta, K.; Ishiyama, T. is a scholarly article available to read on EtoBox.

Author

Shigeta, K.; Ishiyama, T.

Publisher

IEEE Comput. Soc

Published

1998

Language

EN