Opening book details…
Can I read Design for Manufacturability and Yield for Nano-Scale CMOS (Series on Integrated Circuits and Systems) on EtoBox?
Design for Manufacturability and Yield for Nano-Scale CMOS (Series on Integrated Circuits and Systems) by Charles C. Chiang, Jamil Kawa (auth.) is a engineering available to read on EtoBox.
What is Design for Manufacturability and Yield for Nano-Scale CMOS (Series on Integrated Circuits and Systems) about?
<p>Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the design and layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, mask planning, simulation and manufacturing, and through statistical design a
Who reads Design for Manufacturability and Yield for Nano-Scale CMOS (Series on Integrated Circuits and Systems)?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- Charles C. Chiang, Jamil Kawa (auth.)
- Publisher
- Springer Netherlands : Imprint : Springer
- Published
- 2007
- Language
- EN
- ISBN
- 9781402051883
- Category
- engineering
- Subjects
- Engineering, Computer Science, Technology
- Updated
- 2026-03-25
Other editions & translations
More by Charles C. Chiang, Jamil Kawa (auth.)
Browse all works by Charles C. Chiang, Jamil Kawa (auth.)
Similar books
- Nanoscale CMOS VLSI Circuits : Design for Manufacturability — Sandip Kundu; Aswin Sreedhar (2010)
- CMOS Digital Integrated Circuits : Analysis and Design — Sung-mo Kang, Yusuf Leblebici, Yusuf Leb (1999)
- Nano-CMOS Design for Manufacturability : Robust Circuit and Physical Design for Sub-65 Nm Technology Nodes — Ban P. Wong, Anurag Mittal, Greg W. Starr, Franz Zach, Victor Moroz, Andrew Kahng (2008)
- Design for Manufacturability and Statistical Design: A Constructive Approach (Series on Integrated Circuits and Systems) — Michael Orshansky, Sani R. Nassif, Duane Boning (auth.) (2008)
- Embedded Memories for Nano-Scale VLSIs (Integrated Circuits and Systems) — Kevin Zhang (auth.) (2009)
- Semiconductors: Integrated Circuit Design for Manufacturability (Devices, Circuits, and Systems) — Artur Balasinski (2011)
