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About this Engineering article

Complementary metal-oxide-silicon field-effect transistors fabricated in 4-MeV boron-implanted silicon by Terrill, K. W.; Byrne, P. F.; Hu, C.; Cheung, N. W. is a Engineering article available to read on EtoBox.

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Author
Terrill, K. W.; Byrne, P. F.; Hu, C.; Cheung, N. W.
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
1984
Field
Engineering (Physical Sciences)