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About this Computer Science article
Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops by YOTSUYANAGI, Hiroyuki; YAMAMOTO, Masayuki; HASHIZUME, Masaki is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- YOTSUYANAGI, Hiroyuki; YAMAMOTO, Masayuki; HASHIZUME, Masaki
- Publisher
- Oxford University Press; Institute of Electronics, Information and Communications Engineers; Maruzen Co., Ltd/Maruzen Kabushikikaisha; Institute of Electronics, Information and Communications Engineers (IEICE) (ISSN 0916-8532)
- Published
- 2010
- Field
- Computer Science (Physical Sciences)
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